Книга: Microsoft Windows Embedded CE 6.0 Exam Preparation Kit
Customizing Default Tests
Customizing Default Tests
The graphical user interface also enables you to customize the command lines that the workstation server application sends to the test engine (Tux.exe) to perform the tests. To modify the parameters of a test, right-click the test in the Test Catalog and select the Edit Command Line option. For example, the Storage Device Block Driver Benchmark Test analyzes the performance of a storage device by reading and writing data to every sector on the device. This implies that all existing data on the storage device will be destroyed. To protect you from accidental data loss, the Storage Device Block Driver Benchmark Test is skipped by default. To run the Storage Device Block Driver Benchmark Test successfully, you must edit the command line and explicitly add a special parameter called -zorch.
The supported command-line parameters depend on each individual CETK test implementation. Tests might support or require a variety of configuration parameters, such as an index number to identify the device driver to test, or additional information that must be provided to run the test.
NOTE
Command-line parameters for CETK tests
For a complete list of default CETK tests with links to additional information, such as command-line parameters, see the section "CETK Tests" in the Windows Embedded CE 6.0 Documentation, available on the Microsoft MSDN Web site at http://msdn2.microsoft.com/en-us/library/ms893193.aspx.
Оглавление книги
- Running CETK Tests in Standalone Mode
- Default Constructible
- Default connections
- Setting up default policies
- Booting into the Default Runlevel
- Booting to a Nondefault Runlevel with GRUB
- 16.2.2. Customizing Kernel Initialization
- mode and default
- 10.3.3 Customizing Fonts Through Custom
- Setting document defaults
- Using the default Keyword in Generics
- Метод SetDefaultPrinter